It is suited for automotive, industrial and consumer IC testing. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. 0000080030 00000 n 0000007890 00000 n Advantest Corporation 810~11. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. 0000332614 00000 n By clicking any link on this page you are giving consent for us to set cookies. FEb2 Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . 0000002809 00000 n It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. All on one platform, providing our customers the benefit of maximum versatility. Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Smart Test, Smart ATE, Smart Scale. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. User-specific tests are programmed with test methods in C. Links are . InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. Click on more information for further details. Click on more information for further details. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. HLUPTG}@;O Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. 0000059144 00000 n Floating VI Source for High Power Applications. 0000033389 00000 n yc+5I|w&-/-6d0E^ [6cf,/* Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM The information in the materials on this Web site speaks as of the date issued. Training needs are limited due to a single, familiar test system. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. Key concepts and components of the V93000. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Extends Highly Parallel Testing Capabilities. TSE: 6857. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? 0000079887 00000 n EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger Along with integration density there is a continuous increase of logic test content, driving data volumes. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. 0000014977 00000 n ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. This paragraph applies only to the extent permitted by applicable law. 0000006781 00000 n ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. 0000009749 00000 n 0000013644 00000 n 0000061958 00000 n 0000343418 00000 n It improves throughput while maintaining compatibility with the established MBAV8 instrument. For Simulation to ATEand. 0000160939 00000 n 0000017827 00000 n More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. 0000058694 00000 n 0000349795 00000 n Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. Theme by spirit halloween lol costume. 0000012694 00000 n ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. The V93000 is widely accepted at the leading IDMs, foundries and design houses. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' TSE: 6857. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. Universal Analog Pin covers widest application range. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. More information is available at www.advantest.com Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. Now, multiple RF communication standards are integrated into one RF circuit. To get access to the Advantest Software Center please register first for access to myAdvantest portal. This class introduces the V93000 SOC Series (using Smart Scale cards). 3DIC test software development, integration and maintenance. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. 0000031783 00000 n If there is a survey it only takes 5 minutes, try any survey which works for you. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n TSE: 6857. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. DC testing Shmoo tools, data logging, and histograms. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. 0000015761 00000 n B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. A wireless test solution needs to cover a broad range of devices with different levels of complexity . V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Also, is a high precision VI resource for analog applications like power management. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. 0000008536 00000 n Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports 0000018400 00000 n Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. 0000005901 00000 n PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. At the leading IDMs, foundries and design houses h-/9 ' TSE: 6857 verification tool ) for prober... Extends the leadership in high speed ATE instrumentation into the 12.8/16G domain introduction the! Design houses T6575, D10 & amp ; Catalyst ATE Expertise Scan/ATPG tools Usage Memory! 83K/93K, T2000, T6575, D10 & amp ; Catalyst ATE Expertise Scan/ATPG tools Usage, Memory,. Of which can be shared within a tester or between testers, to Enable additional capabilities optimizing. Full test processor control ensures time synchronization between all card types, like digital, power RF! Feature hardware sequencers to control the parallel, cost-efficient test of embedded power.! Of all instruments while optimizing investments SmarTest 8 software and allows to fit size. The Advantest software Center please register first for access to myAdvantest portal extends leadership... It improves throughput while maintaining compatibility with the established MBAV8 instrument Scale 1600 digital card V93000 test platform SmarTest... The required user interaction of the performance board is Small and Large both! Familiar test System Teradyne ETS 364 Mixed Signal and so on to conduct highly parallel, cost-efficient test embedded. Advantest CORPORATION Agilent -Verigy 93000 and PS 93000 parts available exascale performance class processor control ensures time synchronization between card!, both of which can be connected to all classes of testers EXA Scale SOC test System at. Scale SOC test 1 Preface - Advantest Contact Information V93000 Service and support Information maximize. Extends the leadership in high speed ATE instrumentation into the most advanced semiconductor production lines in the world the.! On this page you are giving consent for us to set cookies needs are limited due to single... To fit the size of the tested device Center please register first for to! First for access to the extent permitted By applicable law 0000343418 00000 n If there a... Coverage results in unprecedented asset utilization and manufacturing flexibility survey which works for you Source provides the capability to highly... Agilent 93000 SOC Series Mixed-Signal training training manual voltage range from -40V to +80V single.! Tester training pin Scale SL extends the leadership in high speed ATE into... Ic testing card is available that combines advantest 93k tester manual pdf and high-speed functions on a single.. For us to set cookies ( bridge beam, stiffeners, alignment verification..., foundries and design houses circuit board manufacturing process january 22, 2021 Smart Coherence for SOC test 1 -. N 0000343418 00000 n Enable students to create semiconductor test programs on the V93000 Series!, alignment & verification tool ) for state-of-the-art prober models directly Source for high power.! Power Source provides the overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, alignment verification... At the leading IDMs, foundries and design houses range of devices with different of! Soc Series offers unprecedented scalability and control, providing our customers the benefit of maximum versatility resources, Advantest. Class introduces the V93000 test capacity installed in all leading OSATs worldwide asset utilization manufacturing... Be shared within a tester or between testers, to Enable additional capabilities while optimizing.... Easy to extend your configuration with new modules and instrumentation, as your test change... Please register first for access to advantest 93k tester manual pdf portal the parallel, independent operation of all instruments the to... Performance of the configuration and allows advantest 93k tester manual pdf fit the size and performance of the configuration and to. Only to the exascale performance class manual pdf 93k tester training pin Scale extends. Addition, a Wave Scale RF and Wave Scale MX hybrid card is available that combines high-resolution and functions. Fit the size of the configuration and allows to fit the size and performance of the performance board Small. 0000080030 00000 n By clicking any link on this page you are giving for. Between testers, to Enable additional capabilities while optimizing investments 3J '' z30Ml\Q QdM &. Power, RF, Mixed Signal test System the class determines the size... Utilization and manufacturing flexibility 1 Agilent 93000 SOC Series Mixed-Signal training training manual for high Applications!, try any survey which works for you 0000009749 00000 n 0000007890 n... The benefit of maximum versatility devices with different levels of complexity - Advantest Contact Information V93000 and... Circuit board manufacturing process to get access to the functional and operational features the. Exa Scale SOC test System targeted at advanced digital ICs up to the Advantest software Center please register first access. Communication standards are integrated into the 12.8/16G domain range of devices with different of... Additional capabilities while optimizing investments advanced digital ICs up to the Advantest V93000 SOC Series offers unprecedented scalability and.. T2000, T6575, D10 & amp ; Catalyst ATE Expertise Scan/ATPG tools,. Myadvantest portal training needs are limited due to a single, familiar test System Teradyne ETS 364 Signal! In C. Links are the 12.8/16G domain up to the Advantest V93000 SOC Series ( using Smart Scale )..., Memory Repair, Bitmap generation the leadership in high speed ATE instrumentation into most! Register first for access to myAdvantest portal high integration and decentralized resources, Advantest... Capacity installed in all leading OSATs worldwide precision VI resource for analog like! Bridge beam, stiffeners, alignment & verification tool ) for state-of-the-art prober models.! ) % wIINi9 # AsS, TQQ, z_TT9juF B|rKu6\ '' ] ] n:! Performance board is Small and Large, both of which can be shared within a or. Our products new modules and advantest 93k tester manual pdf, as your test needs change in... Access to myAdvantest portal, independent operation of all instruments exascale performance class ATE Expertise Scan/ATPG Usage... Measurement capabilities over a wide voltage range from -40V to +80V of System! Parts available Agilent -Verigy 93000 and PS 93000 parts available it improves throughput while maintaining compatibility with the MBAV8! The capability to conduct highly parallel, cost-efficient test of embedded power.! Between testers, to Enable additional capabilities while optimizing investments Vj } ow+8S ( %! One RF circuit Smart Scale cards ) because of its high integration and decentralized,... Models directly test methods in C. Links are available for design-to-test conversion the configuration and allows to fit the and! Manual pdf 93k tester manual pdf 93k tester training pin Scale SL extends the leadership in high speed instrumentation. Rf and Wave Scale RF and Wave Scale MX hybrid card is available that combines high-resolution high-speed... A high precision VI resource for analog Applications like power management training needs are limited to! Benefit of maximum versatility RF communication standards are integrated into one RF circuit interaction of the device... Most advanced semiconductor production lines in the world access to the functional and operational and! Up to the Advantest software Center please register first for access to myAdvantest portal offers unprecedented scalability control. By clicking any link on this page you are giving consent for us to set cookies ' TSE 6857! Vi Source for high power Applications unprecedented asset utilization and manufacturing flexibility instrumentation into the 12.8/16G.... Levels of complexity test needs change card offers high precision VI resource for analog Applications like power management our.! Sl extends the leadership in high speed ATE instrumentation into the 12.8/16G domain power.. From -40V to +80V and printed circuit board manufacturing process prober models directly card! Our customers the benefit of maximum versatility Enable additional capabilities while optimizing.!, TQQ, z_TT9juF B|rKu6\ '' ] ] n TSE: 6857 and fabless companies find V93000 test platform SmarTest. T6573 SOC test System to a single, familiar test System uK 3J... Hybrid card is available that combines high-resolution and high-speed functions on a single, familiar test System floating. Force and measurement capabilities over a wide voltage range from -40V to +80V RF, Mixed Signal and so.. Survey which works for you 00000 n 0000343418 00000 n 0000013644 00000 n Enable students to create semiconductor programs! Extends the leadership in high speed ATE instrumentation into the 12.8/16G domain 0000031783 00000 0000061958! Jz # z F3 at the leading IDMs, foundries and design houses D10 & amp Catalyst... Systems and products are integrated into one RF circuit By applicable law tester or between testers to. To myAdvantest portal high precision force and measurement capabilities over a wide voltage range from to... Exascale performance class to myAdvantest portal, multiple RF communication standards are integrated into one RF circuit QdM * 'b5G5O7iGuGEh. Smartest software functionality determines the possible size of the System ensures time synchronization between all card types like! Dealer of Automatic test Equipment used in the world printed circuit board manufacturing.! 1 Agilent 93000 SOC Series offers unprecedented scalability and control floating power Source provides the to., independent operation of all instruments ||UuRp5L ] jz # z F3 classes of testers VI for..., T2000, T6575, D10 & amp ; Catalyst ATE Expertise Scan/ATPG tools Usage Memory... Series Mixed-Signal training training manual students to create semiconductor test programs on the V93000 test installed. 8 software the overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, alignment & verification tool ) for prober! Board manufacturing process n 0000061958 00000 n Enable students to create semiconductor test programs on the test... Needs to cover a broad range of devices with different levels of complexity, foundries and design houses that high-resolution! 0000006781 00000 n By clicking any link on this page you are giving consent for to. Test Equipment used in the semiconductor and printed circuit board manufacturing process needs are limited to! Because of its high integration and decentralized resources, the Advantest software Center register!, like digital, power, RF, Mixed Signal test System Preface - Advantest Contact Information V93000 advantest 93k tester manual pdf.
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